Detector Characterization Lab
Coming soon…
- 800 square feet, Located at NanoFab 203
- Dark current/Photocurrent/Gain measurements
- Excess noise measurement
- Quantum Efficiency (QE) measurement
- SPAD characterizations (DCR/Afterpulsing/Jitter/SPDE)
Device Fabrication and Characterization
NanoFAB, Nanotechnology Research Center (NRC)
- 10,000 square foot, class 100 cleanroom
- E-beam writer/Conventional wet, dry-based photolithography
- Etching/Deposition tools
- AFM/SEM equipped with EDS
- Probe station with a semiconductor parameter analyzer
- Optical Microscope/Nomarski
Material Characterization
Characterization Center for Materials and Biology (C2MB)
- Various high-resolution TEMs and SEMs
- X-ray diffractometer (XRD)
- XPS/Auger system
- Raman Spectroscopy
Shared Characterization Labs
- Prof. Weidong Zhou’s Lab (SWIR Optoelectronics)
: Micro-PL/5K Cryostat/Bandwidth/FTIR - Prof. Robert Magnusson’s Lab (Mid-IR Photonics)
: AFM/FTIR/Ellipsometer