Detector Characterization Lab
NanoFAB 203
- Two Separate Probe Stations: IV/CV/Gain/Excess Noise
Molecular Beam Epitaxy Lab
NanoFAB 105F
- Veeco Gen-II MBE system: III-As/Sb-based material system growth
Device Fabrication
Nanotechnology Research Center (NRC)
- 10,000 square foot, class 100 cleanroom
- E-beam writer/Conventional wet, dry-based photolithography
- Etching/Deposition tools
- AFM/SEM equipped with EDS
- Optical Microscope/Nomarski
Material Characterization
Characterization Center for Materials and Biology (C2MB)
- Various high-resolution TEMs/SEMs
- X-ray diffractometer (XRD)
- XPS/Auger system
- Raman Spectroscopy
- FTIR
Shared Characterization Labs
- Prof. Weidong Zhou’s Lab: PL/TRPL/5K Cryostat/Bandwidth/FTIR
- Prof. Rober Magnusson’s Lab: AFM/FTIR/Ellipsometer